PaperCharge trapping studies in SiO2 using high current injection from Si-rich SiO2 filmsD.J. DiMaria, R. Ghez, et al.Journal of Applied Physics
PaperAuger and ellipsometric studies of ultra-thin PbO growth on leadN.J. Chou, J.M. Eldridge, et al.Journal of Electronic Materials
PaperAn electron microscope investigation of the effect of phosphorous doping on the plasma etching of polycrystalline siliconE.A. Irene, E. Tierney, et al.JES
PaperStrong electric field heating of conduction-band electrons in SiO2T.N. Theis, D.J. Dimaria, et al.Physical Review Letters
