Structural study of SiOx amorphous thin films by the grazing incidence X-ray scattering (GIXS) method
- Eiichiro Matsubara
- Kunioki Kato
- et al.
- 1996
- Science Reports of the Rerearch Institutes Tohoku University Series A-Physics
Publications
3 results for E. Matsubara
Atomic structure analysis of amorphous tb-fe1-xcox film systems
- Yoshimine Kato
- Shinji Takayama
- et al.
- 1991
- Japanese Journal of Applied Physics
Structural Study of Amorphous Tb-Fe-Co Films by X-ray Diffraction
- E. Matsubara
- Y. Waseda
- et al.
- 1990
- Materials Transactions, JIM