Effects of Several Parameters on the Corrosion Rates of Al Conductors in Integrated CircuitsIsrael LernerJerome M. Eldridge2019JES
The Dependence of the Memory Effect in ZnS:Mn A-C Thin Film Electroluminescence on Mn DistributionV. MarrelloA.A. Onton2019JES
Self-Diffusion and Na-K Exchange in βand β”-Na-Gallate Fast Ion ConductorsL.M. FosterD.R. Campbellet al.2019JES
Properties of AI2O3 Films Deposited from the AICI3, CO2, and H2 SystemV.J. SilvestriC.M. Osburnet al.2019JES
Residual Stress, Chemical Etch Rate, Refractive Index, and Density Measurements on SiO2 Films Prepared Using High Pressure OxygenE.A. IreneD.W. Donget al.2019JES
Electrochemical Test to Evaluate Passivation Layers: Overcoats of Si in InkM.H. LeeJ.M. Eldridgeet al.2019JES