Effect of surface chemistry and work function in secondary ion mass spectrometry
- Ming L. Yu
- 1983
- JVSTA
Publications
176 results at JVSTA
Test of structural models for Ag{110}1 2-0 by LEED intensity analysis
- E. Zanazzi
- M. Maglietta
- et al.
- 1983
- JVSTA
Fine-grained base electrode process for Pb-alloy Josephson technology
- A.A. Bright
- S. Klepner
- 1983
- JVSTA
Summary Abstract: Cluster formation and the percolation threshold in thin Au films
- R.B. Laibowitz
- E.I. Alessandrini
- et al.
- 1983
- JVSTA
Chemical bonding and Schottky barrier formation at transition metal-silicon interfaces
- Paul S. Ho
- 1983
- JVSTA
Summary Abstract: Crystallographic structure of coevaporated Ni-Al alloy films
- H.T.G. Hentzell
- B. Andersson
- et al.
- 1983
- JVSTA
Importance of chain reactions in the plasma deposition of hydrogenated amorphous silicon
- Ivan Haller
- 1983
- JVSTA
Chemical bonding and reactions at Ti/Si and Ti/oxygen/Si interfaces
- R. Blitz
- G.W. Rubloff
- et al.
- 1983
- JVSTA
Correlation between the ion bombardment during film growth of Pd films and their structural and electrical properties
- P. Ziemann
- E. Kay
- 1983
- JVSTA
Summary Abstract: Developments in broad-beam ion source technology and applications
- H.R. Kaufman
- J.J. Cuomo
- 1983
- JVSTA