Correlation between the ion bombardment during film growth of Pd films and their structural and electrical propertiesP. ZiemannE. Kay1983JVSTA
Test of structural models for Ag{110}1 2-0 by LEED intensity analysisE. ZanazziM. Magliettaet al.1983JVSTA
Summary Abstract: Crystallographic structure of coevaporated Ni-Al alloy filmsH.T.G. HentzellB. Anderssonet al.1983JVSTA
Importance of chain reactions in the plasma deposition of hydrogenated amorphous siliconIvan Haller1983JVSTA