Noncontact Internal Waveform Measurements with Picosecond Time Resolution on a 0.5-/xm CMOS SRAM
- Yvon Pastol
- Jean-Marc Halbout
- et al.
- 1988
- IEEE Electron Device Letters
Publications
307 results at IEEE Electron Device Letters
Inverter Performance Of Deep-Submicrometer Mosfet'S
- George A. Sai-Halasz
- Matthew R. Wordeman
- et al.
- 1988
- IEEE Electron Device Letters
A New Failure Mode of Radiation-Induced Soft Errors in Dynamic Memories
- T.V. Rajeevakumar
- Nicky C. C. Lu
- et al.
- 1988
- IEEE Electron Device Letters
Monte-Carlo Simulation of Submicrometer Si n-MOSFET's at 77 and 300 K
- Steven E. Laux
- M.V. Fischetti
- 1988
- IEEE Electron Device Letters
Selective Epitaxy Base Transistor (SEBT)
- J.N. Burghartz
- B.J. Ginsberg
- et al.
- 1988
- IEEE Electron Device Letters
p-Channel Quantum-Well Heterostructure MI3 SFET
- Richard A. Kiehl
- Sandip Tiwari
- et al.
- 1988
- IEEE Electron Device Letters
Transient Switching of the Parasitic Bipolar Device of an Epitaxial CMOS Transistor
- Wen-Hsing Chang
- M.D. Rodriguez
- 1987
- IEEE Electron Device Letters
Effect of Off-Axis Implant on the Characteristics of Advanced Self-Aligned Bipolar Transistors
- Ching-Te Chuang
- G.P. Li
- et al.
- 1987
- IEEE Electron Device Letters
Bipolar Transistor with Self-Aligned Lateral Profile
- G.P. Li
- Tze-Chiang Chen
- et al.
- 1987
- IEEE Electron Device Letters
Lateral Encroachment of Extrinsic-Base Dopant in Submicrometer Bipolar Transistors
- Pong-Fei Lu
- G.P. Li
- et al.
- 1987
- IEEE Electron Device Letters