Lynne Gignac received B.S. and M.S. degrees in Ceramic Engineering from U. of Illinois at Urbana-Champaign and a Ph.D. in Materials Science & Engineering from U of Arizona. In 1988, she joined IBM Microelectronics Division in East Fishkill, NY and transferred to IBM Research in 1995. Presently she is a research staff member at IBM T. J. Watson Research Center and studies semiconductor materials and nanotechnology structures using focused ion beam (FIB) microscopes and transmission electron microscopes (TEM). In 2009, she was awarded the Microscopy Society of America Chuck Fiori Outstanding Technologist Award.