James H. (Jim) Stathis  James H. (Jim) Stathis photo         

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Thomas J. Watson Research Center, Yorktown Heights, NY USA
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Professional Associations:  American Physical Society (APS)  |  IEEE Electron Devices Society (EDS)

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Principal Research Staff Member, IBM Research, Yorktown Heights

I am a Principal RSM and work closely with the VP of Government Programs. 

I previously served as manager of a fantastic group of Researchers with deep expertise in electrical characterization of transistor gate dielectrics and transistor reliability, and dielectric breakdown in general, including BEOL dielectrics. My own expertise is in oxide breakdown and circuit reliability . Here's a recent short tutorial.


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