Tin Kam Ho  Tin Kam Ho photo         

contact information

Watson Research Staff Member
Thomas J. Watson Research Center, Yorktown Heights, NY USA


Professional Associations

Professional Associations:  Fellow, IEEE  |  Fellow, International Association of Pattern Recognition


I joined IBM Watson in 2014, and have since been working on deep semantic analysis and machine learning for natural language understanding and artificial intelligence, with applications in conversational systems, question answering, knowledge discovery, among others.

Over my career I have worked in research and applications of pattern recognition, machine learning, data mining, and computational modeling and simulation.  I seek to discover and represent knowledge embedded in large, high-dimensional data sets by algorithmic processes. More specifically, I pursue methods for natural partitioning of data, systematic search for correlations, characterizing complexity of dependences, generation and evaluation of feature transformations, dynamic adjustment of established models, and above all, classification. On classification, I pioneered methods for multiple classifier systems / ensemble learning, random decision forests (a.k.a. random forests), and more recently, data complexity analysis. On a broader theme, I explored methods and tools for interactive data visualization and analysis, and computational modeling and simulation of complex systems.

I was with Bell Labs in 1992-2014, where I led a department in Statistics and Learning Research.  With the team I pursued many data analysis topics in telecommunication, including network monitoring and diagnostics, wireless geolocation, video surveillance, smart grid demand forecasting, telecom user profiling, recommender systems, and customer experience analysis.    Before, I worked on applications in image recognition, multilingual reading machines, as well as simulation, control, and monitoring of continental-scale optical transport systems. 

I served as Editor-In-Chief for Pattern Recognition Letters in 2004-2010, and as Editor or Associate Editor for several other journals including IEEE Transactions on Pattern Analysis and Machine Intelligence, Pattern Recognition, and International Journal on Document Analysis and Recognition.