Dr. Yves Martin joined IBM in 1986 and is presently a research staff member in the Physical Science Dpt. at the IBM Thomas J. Watson Research Center. He has worked on a number of projects related to semiconductor manufacturing and packaging, including testing and characterization, and high precision metrology. He has been involved in the invention and development of several forms of Atomic Force Microscopies (AFM), for metrology and surface characterization on a nanometer scale. He has explored novel near-field inspection techniques involving electric fields over a wide range of frequencies, from DC to optical wavelengths (via focused laser beams) and to X-rays. He has also contributed to the fields of high density data storage (thermal-assisted magnetic storage) and nano-imprint lithography (pattern formation and registration), high-power processor cooling solutions involving novel metallic thermal interfaces, and high-concentration Photo-Voltaic systems for solar energy generation.
Recent activities address opto-electronic challenges, such as bonding micro-lasers onto Silicon Nano-photonic chips.
He has published much of his work and holds 50+ patents in these areas. He obtained his Ph.D. in electrical engineering from University College, London, in 1985, and his engineering degree in physics from Grenoble Institute of Technology, France, in 1981.