Pengyan Wen  Pengyan Wen photo         

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Experienced Researcher
Zurich Research Laboratory, Zurich, Switzerland
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Dr. Pengyan Wen joined IBM Research – Zurich as a Marie Curie Fellow in March of 2020. She is a member in the Physical Information Group of the Science & Technology department.

She holds a PhD in Microelectronics and Solid-State Electronics. Her research interest is on III-V semiconductors, including InP/InGaAs based photodetectors, nanocavity lasers and GaN based Fabry–Perot laser diodes. She has professional hands-on experience with optical, electrical, thermal characterization as well as thermal modeling and device reliability analysis. She is now focusing on thermal characterization of III-V on silicon photodiodes and nanocavity lasers in the Noisefree labs using the Scanning Thermal Microscopy (SThM) and micro-Raman setup.

She holds an EU project with title “Defect Analysis and Thermal Effects of Nanolasers and Emitters -DATENE”.