Materials Analysis     


NICHOLAS FULLER photo Conal E. Murray photoLeslie E. Thompson photo

Materials Analysis - overview

Analytical Techniques and Services

FIB of MRAM It is imperative to have advanced, sensitive materials analysis methods to achieve progress in research, nanoscience and product development. Almaden's Materials Analysis and Characterization department provides the analytical and characterization skills to handle both routine analyses and very challenging measurements on materials, thin films, surfaces and devices at the scale of a few Angstroms. Often, these measurements require parts-per-billion elemental sensitivities. This department does measurements in traditional synthetic polymer chemistry areas (nuclear magnetic resonance, Gel Permeation Chromatography, thermal analysis), in device-driven thin film areas (ion beam techniques, transmission electron microscopy, secondary electron microscopy, Auger spectroscopy, x-ray photoelectron spectroscopy), nano-indentation, and in overlapping areas (focused ion beam methods, scanning probe microscopies). Scientists in this department work interactively with scientists in other departments and follow their progress to plan for future analytical requirements. New techniques are often developed in response to anticipated needs.