Materials Analysis       


 Luisa D. Bozano photoNICHOLAS FULLER photoHsiang Han Hsu photo Conal E. Murray photo Michael Saccomanno photoLeslie E. Thompson photo

Materials Analysis - Scanning Probe Laboratory

Picture of AFM lab The atomic force microscope (AFM) images features on the scale of several Angstroms, nanometers and microns. It is most commonly used to measure topography — profiles of surfaces. An AFM can also be configured to measure other forces, for example: magnetic, electrostatic, adhesive and elastic. By measuring very localized forces over a surface, a map of the surface is produced. By associating the force map with topography, structure-property correlations can be drawn. With the ability to sample forces over very small areas of Angstroms or nanometers, the AFM is an important instrument in documenting the scaling of properties from the traditional 'macroscopic' regime down to the regime of collections of several molecules.

AFM Modes
Microscopy Mode MotionCause
Atomic Force
Scanning Probe

AFM in atomic force mode
Tracking Topography
Lateral Force
Friction Force

AFM in lateral force mode
Twisting Friction
Force Modulation
AFM in force-modulation mode
Bouncing Elasticity

AFM in Force-distance mode
Sticking Adhesion

Our AFM instrumentation operates in several modes: contact, intermittent contact, noncontact and nonscanning. Samples of many different dimensions are accommodated nondestructively on AFM's with both small and large sample stages.

Picture of AFM labTwo large-stage atomic force microscopes (AFM): contact, intermittent contact, and non-contact imaging modes; one with x,y-stage and one with either (r,Theta) or rotary stage. Two small-stage atomic force microscopes (AFM): contact, intermittent contact, and non-contact imaging modes; solution cell; scanners: 5µm, 100µm, and closed loop. Lab's capabilities also include conductive and magnetic force imaging. Projects using AFM characterization