Emmanuel Yashchin  Emmanuel Yashchin photo         

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Research Statistician
Thomas J. Watson Research Center, Yorktown Heights, NY USA


"Asymptotic behaviour of integral functions connected with infinite convolutions of exponential densities for small values of the argument," J. Math. Analysis and Its Applications, 1982, Vol.88, No.2, pp. 348-354, (with P. Feigin).

"Extreme value properties of the explosion time distribution in a pure birth process," J. Appl. Prob., 1982, Vol.19, pp. 500-509, (with P. Feigin).

"On a strong Tauberian result," Z. Wahrscheinlichkeitsth. verw. Geb., 1983, Vol. 65, pp. 35-48, (with P. Feigin).

"On a unified approach to the analysis of two-sided cumulative sum schemes with headstarts," Adv. Appl. Prob., 1985, Vol. 17, pp. 562-593.

"On analysis and design of CUSUM-Shewhart control schemes," IBM Journ. of Res. and Devel., 1985, Vol. 29, pp. 377-391.

"Some aspects of the theory of statistical control schemes" IBM Journ. of Res. and Devel., 1987, Vol. 31, pp. 199-205.

"Weighted Cumulative sum technique" Technometrics, 1989, Vol. 31, pp. 321-338.

"Analysis of Markov-type control schemes by using empirical distributions", 1992, Technometrics, Vol. 34, pp. 54-63

"Performance of Cusum Control Schemes for Serially Correlated Observations", 1993, Technometrics, Vol. 35, 37-52. 1993, Technometrics, Vol. 35, pp. 37-52.

"Statistical Control Schemes: Methods, Applications and Generalizations", 1993, International Statistical Review, Vol. 61, 41-66.

"Monitoring of Variance Components", 1994, Technometrics, Vol. 36, 379-393.

"Likelihood Ratio Methods for Monitoring Variance Components", 1994, IMS Lecture Notes Series on Change-point Problems, Vol. 23, pp. 373-385.

"Monitoring Parameters of a Nested Random Effect Model", 1995, J. Amer. Stat. Association, Vol. 90, pp. 729-738.

"Estimation of the current mean of processes subject to abrupt changes", 1995, Technometrics, Vol. 37, pp. 311-323.

"Inference about Defects in the Presence of Masking", 1996, Technometrics, Vol. 38, pp. 247-255 (with B. Flehinger and B. Reiser).

"Monitoring Active Portfolios Using Statistical Process Control", 1997, Computational Approaches to Economic Problems, eds. H. Amman et al., Kluwer, pp. 193-205 (with D. Stein and T. Philips).

"Change-point Models in Industrial Applications", 1997, Nonlinear Analysis, Vol. 30, pp. 3997-4006.

"Survival with Competing Risks and Masked Causes of Failure", 1998, Biometrika, Vol. 85, pp. 151-164 (with B. Flehinger and B. Reiser).

"Statistical Analysis for Masked Data", 2001, Handbook of Statistics, Vol. 20, (N. Balakrishnan and C. R. Rao, eds.), pp. 499-522 (with B. Flehinger and B. Reiser).

"Parametric Modeling for Survival with Competing Risks and Masked Failure Causes”, 2002, Lifetime Data Analysis, Vol. 8, pp. 177-203 (with B. Flehinger and B. Reiser).

"The Physical Design of On-Chip Interconnections", 2003, IEEE Trans. of Computer-Aided Design of Integrated Circuits and Systems, Vol. 22, No. 3, pp. 254-276 (with M. Wisniewski, R. Franch, D. Conrady, D. Maynard, G. Fiorenza, C. Noyan).

"Estimating the Efficiency of Collaborative Problem-solving, with Application to Chip Design", 2003, IBM J. Res. Development, Vol. 47, No. 1, pp. 77-88 (with M. Wisniewski, R. Franch, D. Conrady, G. Fiorenza, C. Noyan).

"Using Statistical Process Control to Monitor Active Managers", 2003, The J. of Portfolio Management, Vol. 30, No. 1, pp. 86-94 (with D. Stein and T. Philips).

"Application of three-parameter lognormal distribution in EM data analysis", 2006, Microelectronics Reliability, Vol. 46, pp. 2049-2055 (with B. Li, C. Christiansen, J. Gill, R. Filippi, T. Sullivan).

"Threshold electromigration failure time and its statistics for CU interconnects", 2006, J. Appl. Physics, Vol. 100, pp. 114516-1-10 (with B. Li, C. Christiansen, J. Gill, R. Filippi, T. Sullivan).

"Cost (or Price) Forecasting in the Face of Technological Advance", 2007, J. Amer. Statist. Assoc, Vol. 102, No. 477, pp. 28-43 (with D. Harville).

"Modeling of risk losses using size-biased data", 2007, IBM J. Res. Development., Vol. 51, pp. 309-323
"Masked Failure Data", 2008, Encyclopedia of Statistics in Quality and Reliability, eds. F. Ruggeri, R.S. Kenett and F.W. Faltin, Wiley, pp. 1037-1042

"Modeling and forecasting of defect-limited yield in semiconductor manufacturing", 2008, IEEE Transactions of Semiconductor Manufacturing, Vol. 21(4), pp. 614-624 (with M. Baron, A. Takken and M. Lanzerotti) 

"Computational and Monte Carlo Aspects of Systems for Monitoring Reliability Data", 2010, Proc. COMPSTAT-2010, Y. Lechevalier and G. Saporta (eds), pp. 253- 263, Physica Verlag, Paris.

“Statistically regulating program behavior via mainstream computing,”, 2010, Proc. 8th IEEE/ACM Intl. Symp. on code generation and optimization, pp. 238-47 (with M. Stephenson, R. Rangan and E. Van Hensbergen).

“On Detection of Changes in Categorical Data”, 2012, Qual. Technol. and Quant. Management, Vol. 9, pp. 79-96 

“Design and Implementation of Systems for Monitoring Lifetime Data”, 2012,  Frontiers in Statistical Quality Control, pp. 171-195 (Springer) 

“Min-log approach to modeling dielectric breakdown data”, 2012, Proc. IRPS, pp. GD 4.1-4.8 (with B. Li, E. Wu, J. Stathis) 

“Selected Topics in Ultra-Low Emissivity Alpha Particle Detection”, 2013, IEEE Trans. Nuclear Science, Vol. 60(6), pp. 4265-4274 (with M. Gordon, K. Rodbell, H. Tang, B. McNally) 

“Parametric Estimation for Window Censored Recurrence Data”, 2014, Technometrics, Vol. 56(1), pp. 55-66 (with Y. Zhu and J. Hosking) 

“Regenerative Likelihood Ratio Control Schemes”, 2015, Frontiers in Statistical Quality Control, pp. 65-76 (Springer)

Discussion of “Recent Advances in Process Monitoring: Nonparametric and Variable-Selection Methods for Phase 1 and Phase 2”, by G. Capizzi, 2015, Quality Engineering, Vol. 27(1), pp. 44-67 

“Analyzing Path Delays for Accelerated Testing of Logic Chips”, 2015, Proc. IRPS, pp. 6B.4.1-4.7 (with E. Ray, B. Linder, R. Robertazzi, K. Stawiasz, A. Weger, J. Stathis,  P. Song)

Discussion of “Scaling up Process Characterization", by J. Sall (with W. H. Woodall and L. Kodali), 2018, Quality Engineering, Vol. 30(1), pp. 88-92 

“Statistical monitoring of multi-stage processes”, 2018, Frontiers in Statistical Quality Control 12, pp. 185-209 (Springer)

Discussion of “A Review of Some Sampling and Aggregation Strategies for Basic Statistical Process Monitoring (I.M. Zwetsloot and W.H. Woodall) ”, 2019, Journal of Quality Technology 10.1080/00224065.2019.1611356

“Gradient analysis of Markov-type control schemes and its applications”, 2019, Communications in Statistics – Computation and Simulation,   10.1080/03610918.2019.1687718

“Statistical aspects of target-setting for attribute data monitoring”, 2021, Frontiers in Statistical Quality Control 13, pp. 99-119, with A. Civil, J. Komatsu, P. Zulpa (Springer)

“Introduction to Wafer Tomography: Likelihood Based Prediction of Integrated Circuit Yield” (with M. Baron and A. Takken), to appear in the book “Artificial Intelligence, Big Data, Data Science and Machine Learning in Statistics. Challenges, Perspectives and Solutions in Environmental Science, Natural Sciences and Technology”; eds: A. Steland and K.L. Tsui.