A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
This paper describes an experiment in program testing, employing 59 highly experienced data processing professionals using seven methods to test a small PL/I program. The results show that the popular code walkthrough/inspection method was as effective as other computer-based methods in finding errors and that the most effective methods (in terms of errors found and cost) employed pairs of subjects who tested the program independently and then pooled their findings. The study also shows that there is a tremendous amount of variability among subjects and that the ability to detect certain types of errors varies from method to method. © 1978, ACM. All rights reserved.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Renu Tewari, Richard P. King, et al.
IS&T/SPIE Electronic Imaging 1996
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
Charles H. Bennett, Aram W. Harrow, et al.
IEEE Trans. Inf. Theory