True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Bias-dependent scanning tunneling microscopy (STM), used in conjunction with atomic-charge superposition calculations, is shown to provide information on both atomic and electronic surface structure. Si(111)-(7×7) STM images measured with different bias voltages are compared with a number of recent structural models. Striking agreement is found with the stacking-fault-adatom model of Takayanagi. The unit-cell asymmetry found at negative sample bias is attributed to a stacking fault in one half of the unit cell, locally modifying the surface electronic structure. © 1986 The American Physical Society.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Kigook Song, Robert D. Miller, et al.
Macromolecules
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures