Backscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detector

O.C. Wells, R.J. Savoy

Scanning

C.-K. Hu, D. Canaperi, et al.

Thin Solid Films

R.F. Liu, C.-K. Hu, et al.

Journal of Applied Physics

J.M.E. Harper, C. Cabral Jr., et al.

MRS Spring Meeting 1999