Yao Qi, Raja Das, et al.
ISSTA 2009
An analytical technique called thermal diagnostics is presented as a tool for determining the root cause of thermal anomalies arising in electronic equipment. The technique utilizes a dynamically constructed flow network model, real-time inventory, temperature, utilization metrics, and statistical hypothesis testing to select the most likely scenario from among thousands of potential causes of thermal problems. This paper describes the concept of thermal diagnostics and concludes with results from a laboratory evaluation in which we physically trigger thermal anomalies on a running IBM eServer™ BladeCenter® system and record the diagnosis given by the algorithm. In these tests, our algorithm correctly diagnosed the thermal situation and provided meaningful guidance toward clearing the detected problems. ©Copyright 2005 by International Business Machines Corporation.
Yao Qi, Raja Das, et al.
ISSTA 2009
B.K. Boguraev, Mary S. Neff
HICSS 2000
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
N.K. Ratha, A.K. Jain, et al.
Workshop CAMP 2000