Hiroshi Ito, Reinhold Schwalm
JES
A technique is described whereby the direct observation of structural changes resulting from electrical switching can be followed in an electron microscope. It is applied to the amorphous chalcogenide alloys and a brief description of the filament that is formed is presented. © 1972.
Hiroshi Ito, Reinhold Schwalm
JES
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
K.A. Chao
Physical Review B