Hazar Yueksel, Ramon Bertran, et al.
MLSys 2020
We assess dry resist capability to enable full design space random logic at 28 and 36P with a single exposure process below 40mJ.
Hazar Yueksel, Ramon Bertran, et al.
MLSys 2020
Laura Bégon-Lours, Mattia Halter, et al.
MRS Spring Meeting 2023
Ying Zhou, Gi-Joon Nam, et al.
DAC 2023
Katja-Sophia Csizi, Emanuel Lörtscher
Frontiers in Neuroscience