A. Gangulee, F.M. D'Heurle
Thin Solid Films
Recently it has been proposed, based on thermal desorption, electron spectroscopy, and work-function measurements, that extremely small pores and cavities in silver films deposited at temperatures below 150 K are the location of active sites for surface-enhanced Raman scattering. The experiment reported here is an attempt to demonstrate in a more direct way that these cavities are responsible for the observed enhanced Raman scattering. It is shown that by filling these cavities with Xe atoms the enhancement effect on deposited pyridine can be dramatically reduced. © 1985 The American Physical Society.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Peter J. Price
Surface Science
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
R. Ghez, J.S. Lew
Journal of Crystal Growth