Conference paper
Technologies to further reduce soft error susceptibility in SOI
P. Oldiges, R.H. Dennard, et al.
IEDM 2009
P. Oldiges, R.H. Dennard, et al.
IEDM 2009
C.C.-H. Hsu, L.K. Wang, et al.
Journal of Electronic Materials
T.W. Williams, R. Kapur, et al.
EDTC 1996
D. Ventura, Antonio Gnudi, et al.
Applied Mathematics Letters