PaperEffects of inhomogeneities of surface-oxide charges on the electron energy levels in a semiconductor surface-inversion layerT.H. Ning, C.T. SahPhysical Review B
Conference paperCMOS technology roadmap for the next fifteen yearsT.H. NingMicroelectronics and VLSI, TENCON 1995
PaperHistory and future perspective of the modern silicon bipolar transistorT.H. NingIEEE Transactions on Electron Devices