Joseph A Stroscio, R.M. Feenstra, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
The influence of misfit dislocations on the surface morphology of partially strain relaxed Si1-xGex films is studied by atomic force microscopy and transmission electron microscopy. Surface steps arising from the formation of single and multiple 60°dislocations are identified. The role of such steps in the development of a cross-hatch pattern in surface morphology is discussed. © 1995 American Institute of Physics.
Joseph A Stroscio, R.M. Feenstra, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
R.M. Feenstra, P. Mårtensson
Physical Review Letters
R.M. Feenstra, G. Meyer, et al.
Physical Review B - CMMP
F. Legoues, M.O. Ruault, et al.
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties