R.W. Gammon, E. Courtens, et al.
Physical Review B
We report on the interfacial intermixing of ultrathin Co films on a Cu(001) single crystal, two materials that are immiscible in the bulk. With increasing deposition rate we find a crossover from layer-by-layer to bilayer growth due to a hindered diffusion from the first layer to the substrate. Above two monolayers, growth proceeds in a layer-by-layer fashion. These effects are explained in terms of surface free energies. © 1997 Elsevier Science B.V.
R.W. Gammon, E. Courtens, et al.
Physical Review B
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP