PaperResistivity-noise measurements in thin gold films near the percolation thresholdR.H. Koch, R.B. Laibowitz, et al.Physical Review B
PaperHigh-power, pulsed-microwave measurements of critical currents in thin films of Y-Ba-Cu-O and NbN.S. Shiren, R.B. Laibowitz, et al.Physical Review B
PaperProperties of Multilevel Ramp Edge Junctions and SQUIDs with Laser-Ablated SrTiO3 BarriersR.B. Laibowitz, J.Z. Sun, et al.IEEE TAS