Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Perpendicular medium with an average grain size of 8.2nm with 20nm thickness has been produced by using a-CoCrPt/Ti/NiAl tri-layer structure. The signal-to-noise ratio improves with the addition of a NiAl seed layer. From the TEM image analysis, the introduction of the NiAl seed layer may enhance the separation between the CoCrPt grains. The ultra-small grain size will improve the performance of perpendicular media for future high-density recording applications. © 2001 Elsevier Science B.V. All rights reserved.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
J.C. Marinace
JES
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering