Hiroshi Ito, Reinhold Schwalm
JES
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Hiroshi Ito, Reinhold Schwalm
JES
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
John G. Long, Peter C. Searson, et al.
JES