Conference paperCharacterization of thin dielectric films as copper diffusion barriers using triangular voltage sweepS. Cohen, J.C. Liu, et al.MRS Spring Meeting 1999
PaperThermally Developable, Positive Resist Systems with High SensitivityHiroshi Ito, Reinhold SchwalmJES
PaperScanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surfaceP. Martensson, R.M. FeenstraJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperGrowth instability in diffusion controlled polymerizationJ.H. Kaufman, Owen R. Melroy, et al.Synthetic Metals
