Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

View publication

Abstract

No abstract available.

Conference paper

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

Kenneth C.A. Smith, Oliver C. Wells, et al.

IC-CPO 2006

Review

Effects of collector take‐off angle and energy filtering on the BSE image in the SEM

Oliver C. Wells

Scanning

Paper

Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

Oliver C. Wells

Journal of Microscopy

Paper

Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

Oliver C. Wells, L. Gignac, et al.

Scanning

View all publications