Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

Oliver C. Wells, Catherine A. Stoye

Journal of Microscopy

Paper

Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Oliver C. Wells

Scanning

Review

Effects of collector take‐off angle and energy filtering on the BSE image in the SEM

Oliver C. Wells

Scanning

Paper

Isolation of type-2 magnetic contrast in the SEM by a lock-in technique

Oliver C. Wells

Applied Physics Letters

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