Conference paper
The early history and future of the SEM
Oliver C. Wells, David C. Joy
Surface and Interface Analysis
Paper
Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)
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Conference paper
Past, present, and future of backscatter electron (BSE) imaging
Oliver C. Wells, Michael S. Gordon, et al.
ScMi 2012
Conference paper
The history and future of the SEM - A personal view
Oliver C. Wells
M&M 2006
Oliver C. Wells
Journal of Microscopy