Journal of Microscopy

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02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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Abstract

No abstract available.

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An irradiation effect in thermally grown SiO₂

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Applied Physics Letters

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Top-down topography of deeply etched silicon in the scanning electron microscope

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Review of Scientific Instruments

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Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

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Journal of Microscopy

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Low-loss image for surface scanning electron microscope

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