E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
(100)Cu-Ni superlattices with the same Ni thickness, 25 Å, and different Cu thickness, 25-100 Å, have been deposited on (100)Si using a 1000 Å (100)Cu layer as the seed. Magnetic measurement shows a reversal in anisotropy between the in-plane and normal-to-plane magnetization for the samples with 100 Å Cu layers, with the normal-to-plane one being much larger. The reversal is similar to, but less dramatic than the previously observed one for the single Ni layers sandwiched between two 1000 Å Cu layers. The difference is attributed to a smaller lattice distortion of Ni in the Cu-Ni superlattice structures with much thinner Cu layers. The (111)Cu-Ni superlattices of identical composition show signs of changing anisotropy; the in-plane magnetization still remains the larger one for the structures with 100 Å Cu layers. © 1991.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020