Roughening and lower critical dimension in the random-field ising model

G. Grinstein; Shang-Keng Ma

doi:10.1103/PhysRevLett.49.685

Physical Review Letters

Paper

30 Aug 1982

Roughening and lower critical dimension in the random-field ising model

View publication

Abstract

It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates. © 1982 The American Physical Society.

Paper

Chaotic interface dynamics: A model with turbulent behavior

T. Bohr, G. Grinstein, et al.

Physical Review A

Paper

Statistical mechanics of probabilistic cellular automata

G. Grinstein, C. Jayaprakash, et al.

Physical Review Letters

Conference paper

Role of network morphology on texture transitions in polymer stabilized cholesteric liquid crystals

G.A. Held, I. Dierking, et al.

EURODISPLAY 1997

Paper

Phase structure of systems with infinite numbers of absorbing states

M.A. Muñoz, G. Grinstein, et al.

Journal of Statistical Physics

View all publications

Abstract

Related

Chaotic interface dynamics: A model with turbulent behavior

Statistical mechanics of probabilistic cellular automata

Role of network morphology on texture transitions in polymer stabilized cholesteric liquid crystals

Phase structure of systems with infinite numbers of absorbing states