Conference paper
0.25 V FDSOI CMOS technology for ultra-low voltage applications
Hulling Shang, Marvin H. White, et al.
IEEE International SOI Conference 2002
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
Hulling Shang, Marvin H. White, et al.
IEEE International SOI Conference 2002
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VLSI Technology 2011
K.-L. Lee, F. Cardone, et al.
ECS Meeting 2004
E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting