K.-L. Lee, F. Cardone, et al.
ECS Meeting 2004
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
K.-L. Lee, F. Cardone, et al.
ECS Meeting 2004
Kangguo Cheng, A. Khakifirooz, et al.
IEEE International SOI Conference 2010
S.J. Wind, L.T. Shi, et al.
IEDM 1999
Zhen Zhang, F. Pagette, et al.
IEEE Electron Device Letters