PaperGlassy quasithermal distribution of local geometries and defects in quenched amorphous siliconP.C. Kelires, J. TersoffPhysical Review Letters
Conference paperIn situ electron microscopy as a tool for imaging the growth of nanostructuresS. Kodambaka, F.M. Ross, et al.MRS Fall Meeting 2006
PaperCritical island size for layer-by-layer growthJ. Tersoff, A.W. Denier Van Der Gon, et al.Physical Review Letters
