R. Ghez, J.S. Lew
Journal of Crystal Growth
During use X-ray masks will receive very large accumulated doses, perhaps as high as 0.5 MJ/cm2. Because the allowed mask distortion for 0.25 μm ground rules is of the order of 0.075 μm, the permissible radiation-induced distortion is {reversed tilde equals} 0.025 μm, thus requiring substrate materials with negligible distortion when subjected to large radiation doses. The in-plane distortion of various X-ray mask substrate candidates when subjected to large accumulated doses, up to 51,000 J/cm2, is reported. © 1991.
R. Ghez, J.S. Lew
Journal of Crystal Growth
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Frank Stem
C R C Critical Reviews in Solid State Sciences
Imran Nasim, Melanie Weber
SCML 2024