Irem Boybat-Kara
IEDM 2023
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Irem Boybat-Kara
IEDM 2023
Karthik Swaminathan, Martin Cochet, et al.
ISCA 2025
Wei-Tsu Tseng, Emiko Motoyama, et al.
ECS Spring Meeting 2024
An Chen, Stefano Ambrogio, et al.
ECS Spring Meeting 2024