Katsuyuki Sakuma, Roy Yu, et al.
IEDM 2024
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Katsuyuki Sakuma, Roy Yu, et al.
IEDM 2024
Hadjer Benmeziane, Imane Hamzaoui, et al.
IJCAI 2024
R. Bao, L. Qin, et al.
IEDM 2023
Brian Vanderpool, Phillip Restle, et al.
ISSCC 2022