Gerry Strevig, Chris Berry, et al.
ISSCC 2025
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Gerry Strevig, Chris Berry, et al.
ISSCC 2025
Prabudhya Roy Chowdhury, Aakrati Jain, et al.
ECTC 2025
Yousef El-Kurdi, Jerry Quinn, et al.
EMNLP 2022
Max Bloomfield, Amogh Wasti, et al.
ITherm 2025