Ankur Agrawal, Saekyu Lee, et al.
ISSCC 2021
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Ankur Agrawal, Saekyu Lee, et al.
ISSCC 2021
Kaoutar El Maghraoui
ISPASS 2021
Pradip Bose, Jennifer Dworak, et al.
MICRO 2023
Ying Zhou, Gi-Joon Nam, et al.
DAC 2023