Publications

4 results for K.M. DeMeyer

Study of charge trapping as a degradation mechanism in electrically alterable read-only memories
- - C. Falcony
  - D.J. DiMaria
  - et al.
- 1982
- Journal of Applied Physics
Electrically-alterable read-only-memory using Si-rich SiO₂ injectors and a floating polycrystalline silicon storage layer
- - D.J. DiMaria
  - K.M. DeMeyer
  - et al.
- 1981
- Journal of Applied Physics
Dual-Electron-Injector-Structure Electrically Alterable Read-Only-Memory Modeling Studies
- - D.J. Dimaria
  - David W. Dong
  - et al.
- 1981
- IEEE T-ED
TA-A2 Electrically Alterable Read-only Memory Using Si Rich SiO₂ Injectors and a Floating Polycrystalline Silicon Storage Layer
- - D.J. DiMaria
  - K.M. DeMeyer
  - et al.
- 1980
- IEEE T-ED