Electrotransport in copper alloy films and the defect mechanism in grain boundary diffusionF.M. D'HeurleA. Gangulee1975Thin Solid Films
Mass transport during electromigration in aluminum-magnesium thin filmsA. GanguleeF.M. d'Heurle1975Thin Solid Films
Sources of conduction band polarization in the driving force for electromigrationRolf Landauer1975Thin Solid Films
Nucleation of small metal particles on ultrathin SiO2 films on SiL. KasprzakR.B. Laibowitzet al.1974Thin Solid Films
The correlation between light-induced metallic film voltages and time-dependent temperature gradientsR.J. von GutfeldP. Zory1974Thin Solid Films
Grain boundary self-diffusion in evaporated Au films at low temperaturesD. GuptaK.W. Asai1974Thin Solid Films
Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formationS.S. LauW.K. Chuet al.1974Thin Solid Films