PaperFlip-flop upsets from single-event-transients in 65 nm clock circuitsLarry Wissel, David F. Heidel, et al.IEEE TNS
PaperFlip-flop upsets from single-event-transients in 65 nm clock circuitsLarry Wissel, David F. Heidel, et al.IEEE TNS
Conference paperMulti-bit upsets in 65nm SOI SRAMsEthan H. Cannon, Michael S. Gordon, et al.IRPS 2008
PaperSingle-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cellsDavid F. Heidel, Kenneth P. Rodbell, et al.IEEE TNS