Microscopy and Microanalysis

Paper

01 Nov 2002

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Abstract

No abstract available.

Related

Paper

Reduction of edge penetration effect in the scanning electron microscope

Oliver C. Wells

Scanning

Paper

Magnetically filtered low-loss scanning electron microscopy

Oliver C. Wells, Eric Munro

Ultramicroscopy

Paper

Collector turret for scanning electron microscope

Oliver C. Wells, Conrad G. Bremer

Review of Scientific Instruments

Paper

Schlieren method as applied to magnetic recording heads in the scanning electron microscope

Oliver C. Wells, Matthias Brunner

Applied Physics Letters

View all publications