Journal of Microscopy

Paper

02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

View publication

Abstract

No abstract available.

Paper

Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples

Oliver C. Wells, Maurice McGlashan-Powell, et al.

Scanning

Conference paper

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

Kenneth C.A. Smith, Oliver C. Wells, et al.

IC-CPO 2006

Paper

Isolation of type-2 magnetic contrast in the SEM by a lock-in technique

Oliver C. Wells

Applied Physics Letters

Paper

Top-down topography of deeply etched silicon in the scanning electron microscope

Oliver C. Wells, Conal E. Murray, et al.

Review of Scientific Instruments

View all publications