Journal of Microscopy

Paper

02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

Oliver C. Wells, Phillip J. Bailey

Journal of Microscopy

Conference paper

Applications of image diagnostics to metrology quality assurance and process control

John A. Allgair, Victor V. Boksha, et al.

SPIE Advanced Microelectronic Manufacturing 2003

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An irradiation effect in thermally grown SiO₂

Oliver C. Wells

Applied Physics Letters

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Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Oliver C. Wells

Microscopy and Microanalysis

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