Journal of Microscopy

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02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

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Abstract

No abstract available.

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Low-loss image for surface scanning electron microscope

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Applied Physics Letters

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Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

Oliver C. Wells, Catherine A. Stoye

Journal of Microscopy

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XY table and tilting stage for scanning electron microscope (SEM)

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Review of Scientific Instruments

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Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

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Microscopy and Microanalysis

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