Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
X-ray diffraction with synchrotron radiation is used to study the structure and epitaxy of a thin (~ 250 Å) anodic film grown slowly on the basal plane of single-crystal Ti. Anatase crystallites, roughly 130 Å in diameter, are observed, with no indication of other forms of TiO2 or films with lower oxidation state. The oxide is more orientationally disordered than films grown on the (1120) and (1010) faces of Ti, but it exhibits weak six- and twelve-fold texturing by the metal sublayer. In situ and ex situ measurements are qualitatively similar, suggesting that the oxide does not change appreciably upon emersion. © 1994.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP